Integral imaging with increased depth of field and depth of focus by using phase masks

Integral imaging with increased depth of field and depth of focus by using phase masks

Author(s):

A. Castro ( Instituto Nacional de Astrofísica, Óptica y Electrónica, México )
Y. Frauel ( Univ. Nacional Autónoma de México, México )
B. Javidi ( Univ. of Connecticut, USA )

Publication title:

Unmanned/unattended sensors and sensor networks IV : 18-20 September 2007, Florence, Italy

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6736

Pub. Year:

2007

Page(from):

673613-1

Page(to):

673613-9

Pages:

9

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468949 [0819468940]

Language:

English

Call no.:

P63600/6736

Type:

Conference Proceedings

Details

TDL ID:	ZA00052372
Series ID:	PA00000029
Conf. info. (Name):	SPIE Security and Defence : Unmanned/Unattended Sensors and Sensor Networks
Conf. info. (Number):	2007 : 4th
Conf. info. (Venue):	Florence, Italy
Conf. info. (Date):	2007.09.18-2007.09.20
Note for article:	Unmanned/unattended sensors and sensor networks IV, 18-20 September 2007, Florence, Italy - Session 7. Active & passive image sensing & processing, Invited Paper (6736-37)

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