Mask inspection method for 45nm node device

Mask inspection method for 45nm node device

Author(s):

S. Oh ( Hynix Semiconductor Inc., South Korea )
Y. Choi ( Hynix Semiconductor Inc., South Korea )
D. Hwang ( Hynix Semiconductor Inc., South Korea )
G. Jeong ( Hynix Semiconductor Inc., South Korea )
O. Han ( Hynix Semiconductor Inc., South Korea )

Publication title:

Photomask technology 2007

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6730

Pub. Year:

2007

Vol.:

2

Page(from):

673029-1

Page(to):

673029-9

Pages:

9

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468871 [0819468878]

Language:

English

Call no.:

P63600/6730

Type:

Conference Proceedings

Details

TDL ID:	ZA00052371
Series ID:	PA00000029
Conf. info. (Name):	SPIE Photomask Technology : Photomask Technology 2007
Conf. info. (Number):	2007
Conf. info. (Venue):	Monterey, California, USA
Conf. info. (Date):	2007.09.18-2007.09.21
Note for article:	Photomask technology 2007, 18-21 September 2007, Monterey, California, USA - Session 16. Inspection (6730-78)

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