Method for testing aspheric surface with wavelength scanning interferometry

Method for testing aspheric surface with wavelength scanning interferometry

Author(s):

C. Xue ( Changchun Univ. of Science and Technology, China )
F. Huo ( Changchun Univ. of Science and Technology, China )
H. Lv ( Mcoptics Co. Ltd., China )

Publication title:

Optical test and measurement technology and equipment

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6723

Pub. Year:

2007

Vol.:

1

Page(from):

67231V-1

Page(to):

67231V-7

Pages:

7

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468802 [0819468800]

Language:

English

Call no.:

P63600/6723

Type:

Conference Proceedings

Details

TDL ID:	ZA00052369
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Advanced Optical Manufacturing and Testing Technologies
Conf. info. (Number):	2007 : 3rd
Conf. info. (Venue):	Chengdu, China
Conf. info. (Date):	2007.07.08-2007.07.12
Note for article:	3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 8-12 July 2007, Chengdu, China - Potser session (6723-66)

Similar Items:

1 Conference Proceedings Research on special prism processing craft C. Xue, F. Huo, H. Lv Society of Photo-optical Instrumentation Engineers	7 Conference Proceedings New design techniques and calibration methods for CGH-null testing of aspheric surfaces Reichelt, S., Pruss, C., Tiziani, H.J. SPIE-The International Society for Optical Engineering
2 Conference Proceedings Research of fabrication and testing technology of monocrystalline silicon optical elements with super-smooth surfaces C. Xue, F. Huo, C. Zhou Society of Photo-optical Instrumentation Engineers	8 Conference Proceedings Research on the measuring method of the slope error of EUV/x-ray optical elements and measuring apparatus of long trace profiler C. Xue, F. Huo, C. Zhou, W. Deng Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Absolute testing of aspheric surfaces Reichelt, S., Pruss, C., Tiziani, H.J. SPIE - The International Society of Optical Engineering	9 Conference Proceedings The research of basing on simulative compensator and two-wavelength phase shifting interferometry for testing large departure aspheric surface [6024-34] Qiao Y., Tan J., Zhiguo L. SPIE - The International Society of Optical Engineering
4 Conference Proceedings Testing of aspheric surfaces Tiziani,H.J., Reichelt,S., PruB,C., Rocktaschel,M., Hofbauer,U. SPIE-The International Society for Optical Engineering	10 Conference Proceedings Surface topography by wavelength scanning interferometry Yamaguchi,I., Yamamoto,A., Yano,M. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Two-wavelength interferometry in the manufacture process of high-aspheric surfaces Vazquez-Montiel,S., Rodriguez-Hernandez,M.A.C. SPIE-The International Society for Optical Engineering	11 Conference Proceedings Surface profilometry by wavelength scanning interferometry Yamaguchi, Ichirou, Yamamoto, Akihiro, Yano, Masaru SPIE--International Society for Optical Engineering
6 Conference Proceedings A novel aspheric surface testing method using part-compensating lens Liu, H., Hao, Q., Zhu, Q., Sha, D., Zhang, C. SPIE - The International Society of Optical Engineering	12 Conference Proceedings Model-based optimization of interferometers for testing aspherical surfaces Mischo,H.K., Pfeifer,T., Bitte,F. SPIE - The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12