A new Si/CdTe semiconductor Compton camera developed for high-angular resolution

A new Si/CdTe semiconductor Compton camera developed for high-angular resolution

Author(s):

S. Takeda ( Institute of Space and Astronautical Science (Japan) )
S. Ishikawa ( Institute of Space and Astronautical Science (Japan) )
H. Odaka ( Institute of Space and Astronautical Science (Japan) )
S. Watanabe ( Institute of Space and Astronautical Science (Japan) )
T. Takahashi ( Institute of Space and Astronautical Science (Japan) )

Publication title:

Hard X-ray and gamma-ray detector physics IX : 27-29 August 2007, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6706

Pub. Year:

2007

Page(from):

67060S-1

Page(to):

67060S-11

Pages:

11

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468543 [0819468541]

Language:

English

Call no.:

P63600/6706

Type:

Conference Proceedings

Details

TDL ID:	ZA00052352
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Engineering and Applications : Hard X-Ray and Gamma-Ray Detector Physics
Conf. info. (Number):	2007 : 9th
Conf. info. (Venue):	San Diego, California, USA
Conf. info. (Date):	2007.08.27-2007.08.29
Note for article:	Hard X-Ray and Gamma-Ray Detector Physics IX, August 27-29, 2007, San Diego, CA, USA - Session 7. Applications II (6706-27)

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