Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor

Characterization of beryllium and CVD diamond for synchrotron radiation beamline windows and x-ray beam monitor

Author(s):

S. Goto ( SPring-8/JASRI (Japan) )
S. Takahashi ( SPring-8/JASRI (Japan) )
T. Kudo ( SPring-8/JASRI (Japan) )
M. Yabashi ( SPring-8/RIKEN (Japan) )
K. Tamasaku ( SPring-8/RIKEN (Japan) )

Publication title:

Advances in X-ray/EUV optics, components, and applications II : 27-28 August 2007, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6705

Pub. Year:

2007

Page(from):

67050H-1

Page(to):

67050H-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468536 [0819468533]

Language:

English

Call no.:

P63600/6705

Type:

Conference Proceedings

Details

TDL ID:	ZA00052351
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Engineering and Applications : Advances in X-Ray/EUV Optics and Components
Conf. info. (Number):	2007 : 2nd
Conf. info. (Venue):	San Diego, California, USA
Conf. info. (Date):	2007.08.27-2007.08.28
Note for article:	Advances in X-Ray/EUV Optics and Components II, August 27-28, 2007, San Diego, CA, USA - Session 5. Optics and Beam Coherence (6705-17)

Similar Items:

1 Conference Proceedings Optics development for Japanese XFEL project M. Yabashi, A. Higashiya, K. Tamasaku, H. Kimura, T. Kudo, H. Ohashi, S. Takahashi, S. Goto, T. Ishikawa SPIE - The International Society of Optical Engineering	7 Conference Proceedings Submicron focusing of hard x-ray beam by elliptically figured mirrors for scanning x-ray microscopy Mori, Y., Yamauchi, K., Yamamura, K., Mimura, H., Sano, Y., Saito, A., Ueno, K., Endo, K., Souvorov, A., Yabashi, M., … SPIE-The International Society for Optical Engineering
2 Conference Proceedings 1-km beamline at Spring-8 Ishikawa,T., Tamasaku,K., Yabashi,M., Goto,S., Tanaka,Y., Yamazaki,H., Takeshita,K.T., Kimura,H., Ohashi,H., … SPIE-The International Society for Optical Engineering	8 Conference Proceedings Wave-optical analysis of submicron focusing of hard x-ray beams by reflective optics Yamauchi, K., Yamamura, K., Mimura, H., Sano, Y., Saito, A., Kanaoka, M., Endo, K., Souvorov, A., Yabashi, M., Tamasaku, … SPIE-The International Society for Optical Engineering
3 Conference Proceedings CVD diamond films for synchrotron radiation beam monitoring Dabagov,S.B., Vlasov,I.I., Murashova,V.A., Negodaev,M.V., Ralchenko,V.G., Fedorchuk,R.V., Yakimenko,M.N. SPIE - The International Society for Optical Engineering	9 Conference Proceedings Investigation of polycrystalline structure of CVD diamond using white-beam x-ray diffraction A. Souvorov, K. Kajiwara, H. Kimura, S. Goto, T. Ishikawa Society of Photo-optical Instrumentation Engineers
4 Conference Proceedings SPring-8 standard x-ray monochromators Yabashi,M., Yamazaki,H., Tamasaku,K., Goto,S., Takeshita,K.T., Mochizuki,T., Yoneda,Y., Furukawa,Y., Ishikawa,T. SPIE - The International Society for Optical Engineering	10 Conference Proceedings Capillary concentrators for synchrotron radiation beamlines Heald,S.M., Brewe,D.L., Kim,K.H., Brown,F.C., Barg,B., Stern,E.A. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Applications of x-ray intensity interferometry Yabashi, M., Tamasaku, K., Ishikawa, T. SPIE-The International Society for Optical Engineering	11 Conference Proceedings Beryllium windows for synchrotron light sources Lynch,D.R., Berman,L.E., Montanez,P., Pjerov,S., Stefan,P., Woodle,M.H. SPIE-The International Society for Optical Engineering
6 Conference Proceedings Beryllium window for an APS diagnostics beamline Sheng,I.C.A., Yang,B.X., Sharma,S. SPIE-The International Society for Optical Engineering	12 Conference Proceedings Fabrication technology of ultraprecise mirror optics to realize hard x-ray nanobeam Yamauchi, K., Yamamura, K., Mimura, H., Sano, Y., Matsuyama, S., Yumoto, H., Ueno, K., Shibahara, M., Endo, K., Yabashi, … SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12