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Photogrammetric metrology for the James Webb Space Telescope integrated science instrument module

Author(s):
  • M. Nowak ( NASA Goddard Space Flight Ctr. (USA) )
  • A. Crane ( Alliant Techsystems, Inc. (USA) )
  • P. Davila ( NASA Goddard Space Flight Ctr. (USA) )
  • W. Eichhorn ( NASA Goddard Space Flight Ctr. (USA) )
  • J. Gill ( ManTech, Inc. (USA) )
Publication title:
Cryogenic optical systems and instruments XII : 26-27 August 2007, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6692
Pub. Year:
2007
Page(from):
66920P-1
Page(to):
66920P-9
Pages:
9
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468406 [0819468401]
Language:
English
Call no.:
P63600/6692
Type:
Conference Proceedings

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