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Sensitivity analysis of MODIS band-to-band registration characterization and its impact on the science data products

Author(s):
  • Y. Xie ( George Mason Univ. (USA) )
  • X. Xiong ( NASA Goddard Space Flight Ctr. (USA) )
  • J. J. Qu ( George Mason Univ. (USA) )
  • N. Che ( Science Systems and Applications, Inc. (USA) )
  • L. Wang ( George Mason Univ. (USA) )
Publication title:
Remote sensing and modeling of ecosystems for sustainability IV : 28-29 August 2007, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6679
Pub. Year:
2007
Page(from):
667908-1
Page(to):
667908-9
Pages:
9
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468277 [0819468274]
Language:
English
Call no.:
P63600/6679
Type:
Conference Proceedings

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