Blank Cover Image

Far-infrared blocked impurity band detector development

Author(s):
Publication title:
Infrared spaceborne remote sensing and instrumentation XV : 27-30 August 2007, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6678
Pub. Year:
2007
Page(from):
667809-1
Page(to):
667809-11
Pages:
11
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468260 [0819468266]
Language:
English
Call no.:
P63600/6678
Type:
Conference Proceedings

Similar Items:

H. H. Hogue, M. G. Mlynczak, M. N. Abedin, S. A. Masterjohn, J. E. Huffman

Society of Photo-optical Instrumentation Engineers

M.G. Stapelbroek, D.H. Seib, J.E. Huffman, R.A. Florence

Society of Photo-optical Instrumentation Engineers

Olsen,C. S., Beeman,J.W., Haller,E. E.

SPIE-The International Society for Optical Engineering

Ando, K.J., Hoffman, A.W., Love, P.J., Toth, A., Anderson, C., Chapman, G., McCreight, C.R., Ennico, K.A., McKelvey, …

SPIE-The International Society for Optical Engineering

Olsen, C. S., Beeman, J. W., Hansen, W. L., Haller, E. E.

MRS - Materials Research Society

9 Conference Proceedings Space mid-IR detectors from DRS

Hogue, H.H., Guptill, M.T., Reynolds, D.B., Atkins, E.W., Stapelbroek, M.G.

SPIE-The International Society for Optical Engineering

D. S. Tezcan, J. Putzeys, K. De Munck, T. Souverijns, P. Merken

Society of Photo-optical Instrumentation Engineers

Perea,A.G.U., Shen,W.Z., Liu,H.C., Buchanan,M., Schaff,W.J.

SPIE-The International Society for Optical Engineering

Haegel, N.M., Jacobs, J.E., Simoes, J.C., White, A.M.

SPIE

Perera,A.G.U., Shen,W.Z., Francombe,M.H., Shure,M.A., Liu,H.C., Buchanan,M., Schaff,W.J.

SPIE-The International Society for Optical Engineering

Reichertz, L. A., Cardozo, B. L., Beernan, J. W., Larsen, D. I., Tschanz, S., Jakob, G., Katterloher, R., Haegel, N. M., …

SPIE - The International Society of Optical Engineering

Perera,A.G.Unil, Shen,W.Z., Liu,H.C., Buchanan,M., Schaff,W.J.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12