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Criterion of phasing in the presence of segment aberrations

Author(s):
  • S. Wang ( Beijing Institute of Technology (China) )
  • Q. Zhu ( Beijing Institute of Technology (China) )
  • G. Cao ( Beijing Institute of Technology (China) )
  • X. Wang ( Beijing Institute of Technology (China) )
Publication title:
International Symposium on Photoelectronic Detection and Imaging 2007, related technologies and applications : 9-12 September 2007, Beijing China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6625
Pub. Year:
2008
Page(from):
66251A-1
Page(to):
66251A-7
Pages:
7
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467676 [0819467677]
Language:
English
Call no.:
P63600/6625
Type:
Conference Proceedings

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