Image based measurement for the center position error of micro-sphere in micro-target
- Author(s):
- Publication title:
- International Symposium on Photoelectronic Detection and Imaging 2007, optoelectronic system design, manufacturing, and testing : 9-12 September 2007, Beijing China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6624
- Pub. Year:
- 2008
- Page(from):
- 66240X-1
- Page(to):
- 66240X-12
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819467669 [0819467669]
- Language:
- English
- Call no.:
- P63600/6624
- Type:
- Conference Proceedings
Similar Items:
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Imaging geometry and error sensitivity in triangulation-based optical receivers
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
American Institute of Chemical Engineers |
3
Conference Proceedings
Determination of drill paths for percutaneous cochlear access accounting for target positioning error
SPIE - The International Society of Optical Engineering |
American Institute of Chemical Engineers |
4
Conference Proceedings
Based on photo-electro position sensitive detector contour damage diagnosis measurement system research
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Position and attitude measurement of moving target using laser tracking system with multiple measuring stations
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Image sequence segmentation algorithm based on wavelet transform ation with timeline
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Nonuniform sampling of image-based rendering data with the position-interval-error (PIE) function
SPIE-The International Society for Optical Engineering |