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Testing the large aperture optical components by the sub-aperture stitching interferometer

Author(s):
  • Y. He ( Nanjing Univ. of Science & Technology (China) )
  • Z. Wang ( Nanjing Univ. of Science & Technology (China) )
  • Q. Wang ( Nanjing Univ. of Science & Technology (China) )
  • B. Ji ( Nanjing Univ. of Science & Technology (China) )
Publication title:
International Symposium on Photoelectronic Detection and Imaging 2007, optoelectronic system design, manufacturing, and testing : 9-12 September 2007, Beijing China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6624
Pub. Year:
2008
Page(from):
66240D-1
Page(to):
66240D-9
Pages:
9
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467669 [0819467669]
Language:
English
Call no.:
P63600/6624
Type:
Conference Proceedings

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