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Characterization of Thin ZnO Films by Vacuum Ultra-violet Reflectometry

Author(s):
Publication title:
Oxide semiconductors and thin films : symposia held November 25-30, 2012, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1494
Pub. Year:
2013
Page(from):
65
Page(to):
70
Pages:
6
Pub. info.:
Warrendale, Pa: Materials Research Society
ISSN:
02729172
ISBN:
9781605114712 [1605114715]
Language:
English
Call no.:
M23500/1494
Type:
Conference Proceedings

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