Highly Reliable 1060nm Vertical Cavity Surface Emitting Lasers (VCSELs) For Optical Interconnect

Highly Reliable 1060nm Vertical Cavity Surface Emitting Lasers (VCSELs) For Optical Interconnect

Author(s):

S. Kamiya

Publication title:

Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1432

Pub. Year:

2012

Page(from):

3

Page(to):

8

Pages:

6

Pub. info.:

Warrendale, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781605114095 [160511409X]

Language:

English

Call no.:

M23500/1432

Type:

Conference Proceedings

Details

TDL ID:	ZA00051892
Series ID:	PA00000011
Conf. info. (Name):	2012 MRS Spring Meeting ; Symposium G, Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II
Conf. info. (Number):	2012
Conf. info. (Venue):	San Francisco, CA
Conf. info. (Date):	2012.04.09-2012.04.13

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