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High Total-Dose Proton Radiation Tolerance in TiN/HfO2/TiN ReRAM Devices

Author(s):
Publication title:
Materials and physics of emerging nonvolatile memories : symposium held April 9-13, 2012, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
1430
Pub. Year:
2012
Page(from):
165
Page(to):
170
Pages:
6
Pub. info.:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781605114071 [1605114073]
Language:
English
Call no.:
M23500/1430
Type:
Conference Proceedings

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