Activation Energy and Blistering Rate in Hydrogen-implanted Semiconductors
- Author(s):
- Publication title:
- Properties and processes at the nanoscale - nanomechanics of material behavior : symposium held November 28-December 2, 2011, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 1424
- Pub. Year:
- 2012
- Page(from):
- 79
- Page(to):
- 84
- Pages:
- 6
- Pub. info.:
- Warrendale, PA: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605114019 [1605114014]
- Language:
- English
- Call no.:
- M23500/1424
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Dose-Dependent "Activation Energy" for Blistering Phenomenon in Hydrogen-Implanted Silicon
MRS - Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
9
Conference Proceedings
Hydrogen-Induced Blistering of SiC : The Role of Post-Implant Multi-Step Annealing Sequences
Trans Tech Publications |
Materials Research Society |
Trans Tech Publications |
5
Conference Proceedings
Formation of Ti:sapphire via high-temperature processing of Ti-implanted sapphire crystals
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
AMORPHOUS TO POLYCRYSTALLINE TRANSFORMATION IN HIGH DOSE ION IMPLANTED SILICON
Materials Research Society |
Materials Research Society |
12
Conference Proceedings
A MODEL FOR BLISTERING AND SPLITI'ING OF HYDROGEN IMPLANTED SILICON AND ITS APPLICATION TO SILICON-ON-QUARTZ
Electrochemical Society |