Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films

Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films

Author(s):

Yuta Kashiwagi

Publication title:

Advances in spectroscopy and imaging of surfaces and nanostructures : symposium held November 29-December 3, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1318

Pub. Year:

2011

Page(from):

167

Page(to):

172

Pages:

6

Pub. info.:

Warrendale, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781605112954 [160511295X]

Language:

English

Call no.:

M23500/1318

Type:

Conference Proceedings

Details

TDL ID:	ZA00051865
Series ID:	PA00000011
Conf. info. (Name):	2010 MRS Fall Meeting ; Symposium SS, Advanced Imaging and Scattering Techniques for In Situ Studies ; Symposium TT, In Situ X-Ray Synchrotron Radiation Spectroscopies in Energy-Related Materials Science and Heterogeneous Catalysis ; Symposium UU, Real-Time Studies of Evolving Thin Films and Interfaces ; Symposium VV, Novel Development and Applications of Scanning Probe Microscopy
Conf. info. (Number):	2010
Conf. info. (Venue):	Boston, MA
Conf. info. (Date):	2010.11.29-2010.12.03

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