Blank Cover Image

Effect of High-Temperature Electron Irradiation in Deep Submicron MOSFETs

Author(s):
Publication title:
Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
Title of ser.:
ESA SP
Ser. no.:
536
Pub. Year:
2004
Page(from):
443
Page(to):
450
Pages:
8
Pub. info.:
Noordwijk, the Netherlands: ESA Publication Division
ISSN:
03796566
ISBN:
9789290928461 [9290928468]
Language:
English
Call no.:
E11690/536
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Radiation Damage of InGaAs Photodiodes by High-Temperature Electron and Neutron Irradiation

Ohyama, Hidenori, Takakura, Kenichiro, Hayama, Kiyoteru, Simoen, Eddy, Claeys, Cor, Hirao, Toshio

ESA Publication Division
7 Conference Proceedings 1/f noise in deep-submicron CMOS technology for RF and analog applications (Invited Paper)

Mercha, A., Simoen, E., Decoutere, S., Claeys, C.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Floating Body/Floating Well Effects in Deep Submicron MOSFETs at Liquid Nitrogen Temperature

Simoen, E., Hayama, K., Takakura, K., Mercha, A., Claeys, C., Ohyama, H.

Electrochemical Society
8 Conference Proceedings Proton-irradiation effect on the electric-field enhancement of the generation lifetime in shallow P-N junction diodes

Poyai, A., Simoen, E., Claeys, C., Hayama, K., Kobayashi, K., Ohyama, H.

Electrochemical Society
3 Conference Proceedings A Study on Radiation Damage of IGBTs by 2-MeV Electrons at Different Irradiation Temperatures

Nakabayashi, Masakazu, Ohyama, Hidenori, Hanano, Naotika, Kamiya,T., Hirao, T., Simoen, Eddy, Claeys, Cor

ESA Publication Division
9 Conference Proceedings A Study on the Self-Heating Effect in Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures

Pavanello, M.A., Martino, J.A., Simoen, E., Mercha, A., Claeys, C., Dc Meyer, K.

Electrochemical Society
4 Conference Proceedings Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs

Simoen, E., Mercha, A., Claeys, C.

Kluwer Academic Publishers
10 Conference Proceedings Radiation-Induced Back Channel Leakage in 60 MeV-Proton-Irradiated 0.10μm-CMOS Partially Depleted SOI MOSFETs

Rafi, Joan Marc, Mercha, Abdelkarim, Simoen, Eddy, Claeys, Cor, Mohammadzadeh, Ali

ESA Publication Division
5 Conference Proceedings Noise Diagnostics for Advanced Silicon Substrates and Deep Submicron Process Modules

Simoen, E., Mercha, A., Claeys, C.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Degradation of Deep Submicron Partially Depleted SOI CMOS iransistors tinder MEV Proton or Gamma Irradiation

Simoen, E., Rafi, J.M., Mercha, A., De Meyer, K., Claeys, C., Kokkoris, M., Kossionides, E., Fanourakis, G., …

Electrochemical Society
6 Conference Proceedings Noise Diagnostics of Advanced Silicon Substrates and Deep Submicron Process Modules

Simoen, E., Mercha, A., Claeys, C.

Electrochemical Society
12 Conference Proceedings The effect of substrate radiation-induced defects on the operation of deep submicron silicon technologies

Simoen, E., Claeys, C., Poyai, A.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12