Blank Cover Image

Mitigation of Single-Event Transients in CMOS Digital Circuits

Author(s):
Publication title:
Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
Title of ser.:
ESA SP
Ser. no.:
536
Pub. Year:
2004
Page(from):
335
Page(to):
340
Pages:
6
Pub. info.:
Noordwijk, the Netherlands: ESA Publication Division
ISSN:
03796566
ISBN:
9789290928461 [9290928468]
Language:
English
Call no.:
E11690/536
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Focused-Ion-Beam-Assisted Bipolar Transistor Characterization and Analog Single-Event-Transient Circuit Analysis of the OP-27

Rowe, Jason, Massengill, Lloyd, Boulghassoul, Younes, Sternberg, Andrew, Weller, Robert, Buchner, Steve, McMorrow, Dale, …

ESA Publication Division
7 Conference Proceedings Single-event upset studies of a high-speed digital optical data link

Lundquist,J.M., Andrieux,M.L., Dinkespiler,B., Evans,G.A., Ganllin-Martel,L., Pearce,M., Rethore,F., Stroynowski,R., …

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Comparison of Single-Event Transients Induced in an Operational Amplifier (LM124) by Pulsed Laser Light and a Broad Beam of Heavy Ions

Buchner, S., McMorrow, D., Poivey, C., Howard Jr, J.W., Boulghassoul, Y., Massengill, L., Pease, R.L., Savage, M

ESA Publication Division
8 Conference Proceedings Single Event Latchup Protection of Integrated Circuits

Layton, P., Marshall, J., Czajkowski, D, Anthony, H., Boss, R.

European Space Agency
3 Conference Proceedings System-Level Design Hardening Based on Worst-Case ASET Simulations

Boulghassoul, Younes, Adell, Philippe, Rowe, Jason, Massengill, Lloyd, Schrimpf, Ronald, Sternberg, Andrew

ESA Publication Division
9 Conference Proceedings High-speed CMOS: Si light emitters for on-chip optical interconnects

Chatterjee, A., Bhuva, B.L., Cieslik, W.C.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Ultrathin gate oxide degradation under different rates of charge injection

Mongkolkachit,P., Bhuva,B.L., Prasad,S., Bui,N., Kerns,S.E.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings Heavy-Ion Induced Single-Event Upset in Integrated Circuits

Zoutendijk, J.

ESA Publications Division
5 Conference Proceedings Mitigation of Anticipated Transients Without Scram in the ESBWR

Wayne Marquino, Bharat Shiralkar, Shivakumar Sitaraman

American Society of Mechanical Engineers
11 Conference Proceedings CMOS circuit for high-speed flexible read-out of CMOS imagers

Bermak,A., Bouzerdoum,A., Eshraghian,K., Noullet,J.L.

SPIE - The International Society for Optical Engineering
6 Conference Proceedings Digital micromirror device imaging bar for hard copy

W.E. Nelson, R.L. Bhuva

Society of Photo-optical Instrumentation Engineers
12 Conference Proceedings Hot Carrier Reliability Simulation for CMOS Analog Circuits

Pressecq, F., Bordonado, B., Noullet, J.L.

European Space Agency
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12