Experimental Study of Single-Event Transient Current in SOI Devices

Experimental Study of Single-Event Transient Current in SOI Devices

Author(s):

Hirao, Toshio

Publication title:

Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands

Title of ser.:

ESA SP

Ser. no.:

536

Pub. Year:

2004

Page(from):

305

Page(to):

310

Pages:

6

Pub. info.:

Noordwijk, the Netherlands: ESA Publication Division

ISSN:

03796566

ISBN:

9789290928461 [9290928468]

Language:

English

Call no.:

E11690/536

Type:

Conference Proceedings

Details

TDL ID:	ZA00051861
Series ID:	PA00000009
Conf. info. (Name):	7th European Conference on Radiation and its Effects on Components and Systems (RADECS 2003)
Conf. info. (Number):	7th
Conf. info. (Venue):	Noordwijk, The Netherlands
Conf. info. (Date):	2003.09.15-2003.09.19

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