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Temperature Dependence of Single-Event Transient Current Induced by Heavy Ion Microbeam on p+/n/n+ Epilayer Junctions

Author(s):
Gang, Guo
Hirao, Toshio
Laird, Jamie
Onoda, Shinobu
Wakasa, Takeshi
Yamakawa, Takeshi
Kamiya, Tomihiro
2 more
Publication title:
Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
Title of ser.:
ESA SP
Ser. no.:
536
Pub. Year:
2004
Page(from):
295
Page(to):
300
Pages:
6
Pub. info.:
Noordwijk, the Netherlands: ESA Publication Division
ISSN:
03796566
ISBN:
9789290928461 [9290928468]
Language:
English
Call no.:
E11690/536
Type:
Conference Proceedings

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