Reliability Isssues for GaAs and InP -Based Heterojunction Bipolar Transistors

Reliability Isssues for GaAs and InP -Based Heterojunction Bipolar Transistors

Author(s):: K. P. Roenker
Publication title:: Proceedings of the Eighteenth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XVIII)
Title of ser.:: Electrochemical Society Proceedings Series
Ser. no.:: 1993-27
Pub. Year:: 1993
Page(from):: 369
Page(to):: 379
Pages:: 11
Pub. info.:: Pennington, NJ: Electrochemical Society
ISSN:: 01616374
ISBN:: 9781566770699 [1566770696]
Language:: English
Call no.:: E23400/940142
Type:: Conference Proceedings

Details

TDL ID:	ZA00051845
Series ID:	PA00000028
Conf. info. (Name):	Eighteenth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XVIII) : 183rd Meeting of The Electrochemical Society
Conf. info. (Number):	18th ; 183rd
Conf. info. (Venue):	Honolulu, HI
Conf. info. (Date):	1993.05.16-1993.05.21

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