Halt and Microstructure Analysis as Effective Tools in Reliability Improvements of Ceramic Capacitors for High-Rel. Application
- Author(s):
W-T.P. Lu M. Camacho V.T. Barbour S. Stokes W.J. Slusark P.J. Snyder III - Publication title:
- Proceedings of the Symposia on Interconnects, Contact Metallization, and Multilevel Metallization and Reliability for Semiconductor Devices, Interconnects, amd Thin Insulator Materials
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 1993-25
- Pub. Year:
- 1993
- Page(from):
- 470
- Page(to):
- 483
- Pages:
- 14
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770675 [156677067X]
- Language:
- English
- Call no.:
- E23400/940140
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
National Aeronautics and Space Adminstration |
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
Improvement and Analysis of Implanted-Emitter Bipolar Junction Transistors in 4H-SiC
Trans Tech Publications |
Trans Tech Publications |
4
Conference Proceedings
Improvement and Analysis of Implanted-Emitter Bipolar Junction Transistors in 4H-SiC
Trans Tech Publications |
10
Conference Proceedings
Plasma Etched Micro-machined Silicon Stampers for Plastic Bio- Technology Applications
Electrochemical Society |
Society of Automotive Engineers |
11
Technical Paper
Electromechanical Actuator Cooling Fan Reliability Analysis and Safety Improvement
Society of Automotive Engineers |
6
Technical Paper
Modeling of the Photopolymerization Kinetics of Dodecyl Acrylate for the Tipmps flight Investigation.
American Institute of Aeronautics and Astronautics |
12
Conference Proceedings
Microstructure and Physical Properties of Ferroelectric-gate Memory Capacitors with Various Buffer Layers
Materials Research Society |