GaAs HEMT Reliability and Degradation Mechanisms after Long Term Stress Testing
- Author(s):
Erica A. Douglas David Cheney Ke Hung Chen Chih-Yang Chang Lii-Cherng Leu Brent P. Gila Cammy R. Abernathy Stephen J. Pearton - Publication title:
- Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 1195
- Pub. Year:
- 2010
- Page(from):
- 151
- Page(to):
- 160
- Pages:
- 10
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605111681 [1605111686]
- Language:
- English
- Call no.:
- M23500/1195
- Type:
- Conference Proceedings
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