Real-Time Spectroscopic Ellipsometry of Sputtered CdTe Thin Films: Effect of Ar Pressure on Structural Evolution and Photovoltaic Performance
- Author(s):
Robert Collins Michelle Nicole Sestak Jian Li Naba Raj Paudel Kristopher Wieland Jie Chen Courtney Thornberry Alvin Compaan - Publication title:
- Thin-film compound semiconductor photovoltaics--2009 : symposium held April 13-17, 2009, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 1165
- Pub. Year:
- 2010
- Page(from):
- 393
- Page(to):
- 398
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605111384 [1605111384]
- Language:
- English
- Call no.:
- M23500/1165
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
Materials Research Society |
2
Conference Proceedings
Real Time Analysis of Magnetron-Sputtered Thin-Film CdTe by Multichannel Spectroscopic Effipsometry
Materials Research Society |
Materials Research Society |
3
Conference Proceedings
Magnetron Sputtering for Low-Temperature Deposition of CdTe-Based Photovoltaics
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
11
Conference Proceedings
Optical and Physical Characterization of Cu₂₋xSe Thin Films for Real Time Spectroscopic Ellipsometry on Cu(In,Ga)Se₂-Based Photovoltaic Devices
Materials Research Society |
6
Conference Proceedings
*SURFACE MICROSTRUCTURAL EVOLUTION OF ULTRATHIN FILMS BY REAL TIME SPECTROSCOPIC ELLIPSOMETRY
Materials Research Society |
12
Conference Proceedings
Analysis of Compositionally and Structurally Graded Si:H and Si₁₋xGex:H Thin Films by Real Time Spectroscopic Ellipsometry
Materials Research Society |