Spectroscopic Ellipsometry Methods for Thin Absorbing Coatings

Spectroscopic Ellipsometry Methods for Thin Absorbing Coatings

Author(s):

J.N. Hilfiker ( J.A. Woollam Company, Lincoln, NE )
R.A. Synowicki ( J.A. Woollam Company, Lincoln, NE )
H.G. Tompkins ( Consultant, Chandler, AZ )

Publication title:

51st annual technical conference proceedings, April 19-24, 2008, Chicagom, IL

Title of ser.:

Annual Technical Conference of Society of Vacuum Coaters

Ser. no.:

51

Pub. Year:

2008

Page(from):

511

Page(to):

516

Pages:

6

Pub. info.:

Albuquerque, NM: Society of Vacuum Coaters

ISSN:

07375921

Language:

English

Call no.:

A63930/51

Type:

Conference Proceedings

Details

TDL ID:	ZA00049388
Series ID:	PA00000013
Conf. info. (Name):	Society of Vacuum Coaters. Annual technical conference
Conf. info. (Number):	2008 : 51th
Conf. info. (Venue):	Chicagom, IL, USA
Conf. info. (Date):	2008.04.19-2008.04.24

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