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Recent Advances in Optical Characterization of Thin Films by Spectroscopic Ellipsometry

Author(s):
D.E. Aspnes ( Physics Dept., North Carolina State University, Raleigh, NC )  
Publication title:
48th annual technical conference proceedings, April 23-28, 2005, Denver, Colorado
Title of ser.:
Annual Technical Conference of Society of Vacuum Coaters
Ser. no.:
48
Pub. Year:
2005
Page(from):
337
Page(to):
340
Pages:
4
Pub. info.:
Albuquerque, NM: Society of Vacuum Coaters
ISSN:
07375921
Language:
English
Call no.:
A63930/48
Type:
Conference Proceedings

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