Passivation of Semiconductor Surfaces for Improved Radiation Detectors: X-Ray Photoemission Analysis

Passivation of Semiconductor Surfaces for Improved Radiation Detectors: X-Ray Photoemission Analysis

Author(s):

A. J. Nelson

Publication title:

Nuclear radiation detection materials : symposium held November 28-29, 2007, Boston, Massachusetts, U.S.A./ editors, Arnold Burger ... [et al.]

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

1038

Pub. Year:

2007

Page(from):

109

Page(to):

114

Pages:

6

Pub. info.:

Warrendale, Pa: Materials Research Society

ISSN:

02729172

ISBN:

9781558999855 [155899985X]

Language:

English

Call no.:

M23500/1038

Type:

Conference Proceedings

Details

TDL ID:	ZA00049363
Series ID:	PA00000011
Conf. info. (Name):	Materials Research Society Meeting
Conf. info. (Number):	2007
Conf. info. (Venue):	Boston, Massachusetts, USA
Conf. info. (Date):	2007.11.28-2007.11.29

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