Algorithms for Extraction of Nanowires Attributes From Optical Section Microscopy Images

Algorithms for Extraction of Nanowires Attributes From Optical Section Microscopy Images

Author(s):

Publication title:

27th Computers and Information in Engineering Conference, Parts A and B; Volume 2

Title of ser.:

ASME Symposia Volumes

Ser. no.:

DETC 2007(2A)

Pub. Year:

2007

Vol.:

2A

Paper no.:

DETC2007-35456

Page(from):

279

Page(to):

290

Pages:

12

Pub. info.:

New York, N.Y.: American Society of Mechanical Engineers

ISBN:

9780791848036 [0791848035]

Language:

English

Call no.:

A11633/2007

Type:

Conference Proceedings

Details

TDL ID:	ZA00048614
Series ID:	PA00000270
Conf. info. (Name):	ASME Design Engineering Technical Conference ; Computers and Information in Engineering Conference
Conf. info. (Number):	2007 ; 27th
Conf. info. (Venue):	Las Vegas, Nevada USA
Conf. info. (Date):	2007.09.04-2007.09.07

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