Blank Cover Image

Infrared Absorption Spectroscopy of Complexes in Low Carbon Concentration, Low Dose Irradiated CZ Silicon Crystal

Author(s):
Publication title:
High purity silicon 9
Title of ser.:
ECS transactions
Ser. no.:
3(4)
Pub. Year:
2006
Page(from):
313
Page(to):
320
Pages:
8
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775045 [1566775043]
Language:
English
Call no.:
E23400/3-4
Type:
Conference Proceedings

Similar Items:

Y. Yonezawa, N. Inoue, Y. Takubo, Y. Goto, T. Sugiyama

Electrochemical Society

Shirakawa,Y., Yamada-Kaneta,H., Ogawa,T.

Trans Tech Publications

N. Inoue, M. Nakatsu, V. Akhmetov

Electrochemical Society

Nakatsu, M., Hashimoto, A., Natsume, A., Inoue, N., Ono, H.

Electrochemical Society

Hashimoto, A., Matsumoto, T., Funao, D., Inoue, N.

Electrochemical Society

9 Conference Proceedings Segregation of Nitrogen in Cz Silicon

Inoue, N.

Electrochemical Society

N. Inoue, A. Karen, H. Yagi, K. Masumoto, M. Shinomiya, K. Kashima, K. Eifuku, M. Koizumi, T. Takahashi, T. Takenawa, K. …

Electrochemical Society

Funao, D., Ohkubo, I., Inoue, N., Karoui, A., Rozgonyi, G.A.

Electrochemical Society

Inoue, N., Fujiyama, N., Yagi, H.

SPIE-The International Society for Optical Engineering

11 Conference Proceedings Nucleation of Void Defects in Cz Silicon

Yamanaka, Y., Tanahashi, K., Mikayama, T., Inoue, N., Mon, A.

Electrochemical Society

Inoue, N., Fujiyama, N., Yagi, H.

Electrochemical Society

12 Conference Proceedings Nucleation of Void Defects in Cz Silicon

Yamanaka,Y., Tanahashi,K., Mikayama,T., Inoue,N., Mori,A.

Electrochemical Society, SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12