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Standardization of Characterization of Bulk Microdefects and Denuded Zones in Annealed CZ Si

Author(s):
R. Takeda
N. Inoue
K. Moriya
K. Kashima
K. Nakashima
M. Kato
S. Kitagawa
T. Ono
H. Urushido
N. Nango
V. Akhmetov
6 more
Publication title:
Silicon materials science and technology X
Title of ser.:
ECS transactions
Ser. no.:
2(2)
Pub. Year:
2006
Page(from):
471
Page(to):
484
Pages:
14
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566774390 [156677439X]
Language:
English
Call no.:
E23400/2-2
Type:
Conference Proceedings

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