A Gravimetric Technique to Determine the Ciystallite Size Distribution in High Porosity Nanoporous Silicon | 東京工業大学附属図書館文献データベース

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A Gravimetric Technique to Determine the Ciystallite Size Distribution in High Porosity Nanoporous Silicon

Author(s):: M. du Plessis
Publication title:: Microelectronics Technology and Devices : SBMICRO 2007
Title of ser.:: ECS transactions
Ser. no.:: 9(1)
Pub. Year:: 2007
Page(from):: 133
Page(to):: 142
Pages:: 10
Pub. info.:: Pennington, N.J.: Electrochemical Society
ISSN:: 19385862
ISBN:: 9781566775656 [1566775655]
Language:: English
Call no.:: E23400/9-1
Type:: Conference Proceedings

Details

TDL ID:	ZA00047130
Series ID:	PA00000034
Conf. info. (Name):	International Symposium on Microelectronics Technology and Devices : SBMicro
Conf. info. (Number):	22nd : 2007
Conf. info. (Venue):	Rio deJaneiro, Brazil
Conf. info. (Date):	2007.09.03-2007.09.06

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