Blank Cover Image

Advanced ESD Protection Solutions in CMOS/BiCMOS Technologies

Author(s):
Publication title:
Microelectronics Technology and Devices : SBMICRO 2007
Title of ser.:
ECS transactions
Ser. no.:
9(1)
Pub. Year:
2007
Page(from):
97
Page(to):
102
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775656 [1566775655]
Language:
English
Call no.:
E23400/9-1
Type:
Conference Proceedings

Similar Items:

Huang, J.-B, Wang, G.

SPIE-The International Society for Optical Engineering

7 Conference Proceedings Metal gates for advanced CMOS technology

Maiti,B., Tobin,P.J.

SPIE - The International Society for Optical Engineering

Regolini, J. L.

MRS - Materials Research Society

Yue, J., Liou, H.K., Liu, S.T.

Electrochemical Society

LlOU, JUIN J.

Electrochemical Society

KiTTL, J. A. 1, PAWLAK, M. A., LAUWERS, A., SCHRAM, T., POURTOIS, G., VELOSO, A., Yu, H., HOFFMANN, T., DEMEURISSE, C., …

Electrochemical Society

Chen, J., Wu, J., Liu, K., Yang, H., Scott, D.

SPIE - The International Society of Optical Engineering

10 Conference Proceedings Advanced Metal Gate FinFET CMOS TEchnology

Y. Liu, T. Matsukawa, K. Endo, M. Masahara, S. Ouchi

Electrochemical Society

Chang, K., Thomas, S. G., Lee, T.-C., Gregory, R. B., O'Meara, D., Noering, K., Kirchgessner, J., Fresquet, G., Parker, …

MRS-Materials Research Society

Zimmermann, H., Swoboda, R., Schneider, K., Knorr, J.

SPIE-The International Society for Optical Engineering

Chouikha,M.Ben, Lu,G.N., Sedjil,M., Sou,G.

SPIE-The International Society for Optical Engineering

H. Nishizawa, S. Azuma, T. Yoshitake, H. Masuda, M. Kawaji, A. Anzai

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12