Z. Cai, Y. Nakayama, T. Shiono
Elsevier
|
Pedro Serna, Dicle Yardimci, J.D. Kistler, Bruce C. Gates
American Institute of Chemical Engineers
|
H.-J. Ban, W.-S. Ahn, T.-J. Kim
Elsevier
|
Ackermann, J., Klemm, E., Emig, G.
Elsevier
|
T. Shiono, Z. Cai, Y. Nakayama
Elsevier
|
Ito, M., Terada, S., Higashino, Y., Koyasu, Y.
Elsevier
|
Yunya Zhang, Christopher T. Williams, John R. Monnier
American Institute of Chemical Engineers
|
Nawaporn Intaragamjon, Takeshi Shiono, Piyasan Praserthdam
Elsevier
|
Yunya Zhang, Christopher T. Williams, John R. Monnier
American Institute of Chemical Engineers
|
Lee, K. -H., Catani, R., Miglio, R., Wolf, E. E.
Elsevier
|
Yunya Zhang, Christopher T. Williams, John R. Monnier
American Institute of Chemical Engineers
|
Bolt M. H., Laib J. R.
Plenum Press
|