M. Okada, Y. Nakayama, T. Shiono
Elsevier
|
Kim, J.-B., Kim, K.S.
SPIE-The International Society for Optical Engineering
|
T. Shiono, Z. Cai, Y. Nakayama
Elsevier
|
Patil, Abhimanyu O., Zushma, Stephen, Stibrany, Robert T., Rucker, Steven P., Wheeler, Louise M.
American Chemical Society
|
Z. Cai, Y. Nakayama, T. Shiono
Elsevier
|
D.W. Lee, I.-M. Lee, C. Kim(b)
Elsevier
|
Ishii, S., Mitani, M., Saito, J., Matsuura, S., Furuyama, R., Fujita, T.
Elsevier
|
Das, P. K., Dockter, D. W., Fahey, D. R., Lauffer, D. E., Hawkins, G. D., Li, J., Zhu, T., Cramer, C. J., Truhlar, …
American Chemical Society
|
Kato, T., Uchino, H., Iwama, N., Osano, Y., Sugano, T.
Elsevier
|
Wynne, James H., Lloyd, Christopher T., Bullock, Steven E., Cozzens, Robert F.
Materials Research Society
|
Hagimoto, H., Shiono, T., Ikeda, T.
Elsevier
|
Q.S. Shi, B.F. Hu, Q.Y. Liang, T.Q. Liu
Trans Tech Publications
|