Ishihara, R., Wilt, P.C., Dijk, B.D., Metselaar, J.W., Beenakker, C.I.M.
SPIE-The International Society for Optical Engineering
|
M. He, R. Ishihara, W. Metselaar, K. Beenakker
Electrochemical Society
|
Rana, V., Ishihara, R., Hiroshima, Y., Abe, D., Inoue, S., Shimoda, T., Metselaar, J.W., Beenakker, C.I.M
Materials Research Society
|
Ishihara, R., van der wilt, P.Ch., van Dijk, B.D., Metselaar, J.W., Beenakker, C.I.M.
Electrochemical Society
|
Rana, V., Ishihara, R., Hiroshima, Y., Abe, D., Inoue, S., Shimoda, T., Metselaar, J.W., Beenakker, C.I.M.
Materials Research Society
|
Materials Research Society
|
V. Nadazdy, V. Rana, R. Ishihara, S. Lanyi, R. Durny, J. W. Metselaar, C. I. M. Beenakker
Materials Research Society
|
Materials Research Society
|
M. He, E. J. J. Neihof, Y. Van Andel, H. Schellevis, R. Ishihara, J. W. Metselaar, C. I. M. Beenakker
Materials Research Society
|
Ishihara,R., Wilt,P.Ch.van der, Dijk,B.D.van, Burtsev,A., Voogt,F.C., Bertens,G.J., Metselaar,J.W., Beenakker,C.I.M.
SPIE-The International Society for Optical Engineering
|
Rana, V., Ishihara, R., Andel, I., Hiroshima, Y., Abe, D., Inoue, S., Shimoda, T., Metselaar, J.W., Beenakker, K.
Electrochemical Society
|
A. Baiano, J. Tan, R. Ishihara, K. Beenakker
Electrochemical Society
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