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Damage threshold of sapphire in short and long pulse regime

Author(s):
O. Uteza ( LP3, CNRS, Univ. de la Mediterranee (France) )
B. Bussiere ( LP3, CNRS, Univ. de la Mediterranee (France) and Amplitude Technologies (France) )
F. Canova ( LOA, ENSTA, Ecole Polytechnique (France) )
J. Chambaret ( LOA, ENSTA, Ecole Polytechnique (France) )
P. Delaporte ( LP3, CNRS, Univ. de la Mediterranee (France) )
T. Itina ( LP3, CNRS, Univ. de la Mediterranee (France) )
M. Sentis ( LP3, CNRS, Univ. de la Mediterranee (France) )
2 more
Publication title:
Laser-assisted micro- and nanotechnologies : International Conference on Lasers, Applications, and Technologies 2007 : 28 May-1 June 2007, Minsk, Belarus
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6732
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819468901 [0819468908]
Language:
English
Call no.:
P63600/6732
Type:
Conference Proceedings

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