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Phase detection from two phase-shifting interferograms

Author(s):
  • Y. Zhu ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • L. Liu ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • Y. Zhi ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • Z. Luan ( Shanghai Institute of Optics and Fine Mechanics (China) )
  • D. Liu ( Shanghai Institute of Optics and Fine Mechanics (China) )
Publication title:
Optical manufacturing and testing VII : 28-29 August 2007, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6671
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819468192 [0819468193]
Language:
English
Call no.:
P63600/6671
Type:
Conference Proceedings

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