Blank Cover Image

Impact of BOX/substrate interface on low frequency noise in FD-SOI devices

Author(s):
Publication title:
Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6600
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467379 [0819467375]
Language:
English
Call no.:
P63600/6600
Type:
Conference Proceedings

Similar Items:

L. Zafari, J. Jomaah, G. Ghibaudo, O. Faynot, A. Vandooren

Electrochemical Society

Jomaah, J., Balestra, F., Ghibaudo, G.

Electrochemical Society

Jomaah, J, Ghibaudo, G, Balestra, F

Electrochemical Society

Dauge, F., Jomaah, J., Ghibaudo, G.

Electrochemical Society

Jomaah, J., Balestra, F.

SPIE-The International Society for Optical Engineering

Jomaah, J., Balestra, F.

Kluwer Academic Publishers

Ghibaudo, G.

SPIE-The International Society for Optical Engineering

Autran, J. L., Masson, P., Ghibaudo, G.

MRS-Materials Research Society

Jomaah, J, Ghibaudo, G, Pelloie, J L, Balestra, F

Electrochemical Society

11 Conference Proceedings Low-noise SOI Hall devices

Haddab, Y., Mosser, V., Lysowec, M., Suski, J., Demeus, L., Renaux, C., Adriensen, S., Flandre, D.

SPIE-The International Society for Optical Engineering

J. Jomaah, F. Balestra, G. Ghibaudo

Electrochemical Society

Jomaah, J., Ghibaudo, G., Balestra, F.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12