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Low-frequency noise characterizations of GaN-based visible-blind UV detectors fabricated using a double buffer layer structure

Author(s):
  • H. F. Lui ( The Hong Kong Polytechnic Univ. (Hong Kong China) )
  • W. K. Fong ( The Hong Kong Polytechnic Univ. (Hong Kong China) )
  • C. Surya ( The Hong Kong Polytechnic Univ. (Hong Kong China) )
Publication title:
Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6600
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467379 [0819467375]
Language:
English
Call no.:
P63600/6600
Type:
Conference Proceedings

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