Blank Cover Image

Origins of randomness in statistical and quantum mechanics

Author(s):
M. B. Weissman ( Univ. of Illinois at Urbana-Champaign (USA) )  
Publication title:
Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6600
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467379 [0819467375]
Language:
English
Call no.:
P63600/6600
Type:
Conference Proceedings

Similar Items:

WEISSMAN I.

D. Reidel Publishing Company

Scheffler, M., Kratzer, P.

Kluwer Academic Publishers

Wadati, M., Kato, G., Iida, T.

Kluwer Academic Publishers

3 Conference Proceedings Statistical Mechanics of Vortex Lines

Dogson W. J. M., Blatter G., Geshkenbein B. V., Nordlorg H., Wagner S. O.

Kluwer Academic Publishers

Giachetti Riccardo, Tognetti Valerio, Vaia Ruggero

Plenum Press

Nightingale P. M.

Kluwer Academic Publishers

Kampen van G. N.

Plenum Press

Duras, M. M.

SPIE - The International Society of Optical Engineering

11 Conference Proceedings Statistical Mechanics of Interfaces

Widom B.

Plenum Press

McCoy M. B.

Plenum Press

12 Conference Proceedings Statistical Fracture Mechanics

Chudnovsky A., Kunin B.

Plenum Press

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12