Defects density and carrier lifetime in nitrogen-doped ultrananocrystalline and polycrystalline diamond films

Defects density and carrier lifetime in nitrogen-doped ultrananocrystalline and polycrystalline diamond films

Author(s):

M. C. Rossi ( Univ. of Roma Tre (Italy) )
S. Salvatori ( Univ. of Roma Tre (Italy) )
A. Minutello ( Univ. of Roma Tre (Italy) )
G. Conte ( Univ. of Roma Tre (Italy) )
V. Ralchenko ( General Physics Institute (Russia) )

Publication title:

Nanotechnology III : 2-4 May 2007, Maspalomas, Gran Canaria, Spain

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6591

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819467195 [0819467197]

Language:

English

Call no.:

P63600/6591

Type:

Conference Proceedings

Details

TDL ID:	ZA00046898
Series ID:	PA00000029
Conf. info. (Name):	Microtechnologies for the New Millennium : Nanotechnology
Conf. info. (Number):	2007 : 3rd
Conf. info. (Venue):	Maspalomas, Gran Canaria, Spain
Conf. info. (Date):	2007.05.02-2007.05.04

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