State-of-the-art thin film X-ray optics for synchrotrons and FEL sources

State-of-the-art thin film X-ray optics for synchrotrons and FEL sources

Author(s):

F. Hertlein ( Incoatec GmbH (Germany) )
J. Wiesmann ( Incoatec GmbH (Germany) )
C. Michaelsen ( Incoatec GmbH (Germany) )
M. Stoermer ( GKSS Research Ctr. (Germany) )
A. Seifert ( Carl Zeiss Laser Optics GmbH (Germany) )

Publication title:

Damage to VUV, EUV, and X-ray optics : 18-19 April 2007,Prague, Czech Republic

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6586

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819467140 [0819467146]

Language:

English

Call no.:

P63600/6586

Type:

Conference Proceedings

Details

TDL ID:	ZA00046893
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optics and Optoelectronics : Damage to VUV, EUV, and X-ray Optics
Conf. info. (Number):	2007
Conf. info. (Venue):	Prague, Czech Republic
Conf. info. (Date):	2007.04.18-2007.04.19

Similar Items:

1 Conference Proceedings Characterization of amorphous carbon films as total-reflection mirrors for XUV free-electron lasers Jacobi, S., Steeg, B., Wiesmann, J., Stoermer, M., Feldhaus, J., Bormann, R., Michaelsen, C. SPIE-The International Society for Optical Engineering	7 Conference Proceedings Diffractive Optics-State of the Art, Turunen,J., Wyrowski,F. SPIE-The International Society for Optical Engineering
2 Conference Proceedings Optimized performance of graded multilayer optics for x-ray single-crystal diffraction Michaelsen, C., Wiesmann, J., Hoffmann, C., Oehr, A., Storm, A.B., Seijbel, L.J. SPIE - The International Society of Optical Engineering	8 Conference Proceedings Polycapillary X-ray Optics for Thin-Film Strain and Texture Analysis Hofmann, F. A., Gibson, W. M., Lee, S. M., MacDonald, C. A., Ullrich, J. B., Gao, N. MRS - Materials Research Society
3 Conference Proceedings Recent developments of multilayer mirror optics for laboratory x-ray instrumentation Michaelsen, C., Wiesmann, J., Hoffmann, C., Wulf, K., Bruegemann, L., Storm, A. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Picosecond pump-probe using an FEL and synchrotron source K.D. Straub, J.M.J. Madey, P.G. O'Shea, V.N. Litvinenko, E.B. Szarmes Society of Photo-optical Instrumentation Engineers
4 Conference Proceedings Tapered monocapillary optics for synchrotron x-ray microfocusing Balaic, D.X., Barnea, Z., Varghese, J.N., Cholewa, M., Dillon, C.T., Lay, P.A., Shea-McCarthy, G. SPIE	10 Conference Proceedings La/B4C multilayer mirrors for x-rays below 190 eV Michaelsen,C., Wiesmann,J., Bormann,R., Nowak,C., Dieker,C., Hollenster,S., Jager,W. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Microstructure Evolution During Solid-State Reactions in Polycrystalline Nb/AI and Ti/AI Multilayer Thin Films Barmak, K., Cabral, C., Carpenter, D. T., Lavoie, C., Lucadamo, G., Michaelsen, C., Rickman, J. M. Materials Research Society	11 Conference Proceedings Reactive Phase Formation in Thin Films: Evolution of Grain Structure Barmak, K., Michaelsen, C., Rickman, J., Dahms, M. MRS - Materials Research Society
6 Conference Proceedings High-power sources for EUV lithography: state of the art Stamm, U., Kleinschmidt, J., Gaebel, K.M., Birner, H., Ahmad, I., Bolshukhin, D., Brudermann, J., Chinh, T.D., Flohrer, … SPIE - The International Society of Optical Engineering	12 Conference Proceedings Laterally graded multilayer optics for x-ray analysis Schuster,M.R., Gobel,H., Brugemann,L., Bahr,D., Burgazy,F., Michaelsen,C., Stormer,M., Ricardo,P., Dietsch,R., Holz,T., … SPIE - The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12