Application of particle analysis to transmission electron microscopy (TEM)
- Author(s):
J. DaPonte ( Southern Connecticut State Univ. (USA) ) T. Sadowski ( Southern Connecticut State Univ. (USA) ) C. C. Broadbridge ( Southern Connecticut State Univ. (USA) ) D. Day ( Southern Connecticut State Univ. (USA) ) A. H. Lehman ( Southern Connecticut State Univ. (USA) ) D. Krishna ( Southern Connecticut State Univ. (USA) ) L. Marinella ( Southern Connecticut State Univ. (USA) ) P. Munhutu ( Southern Connecticut State Univ. (USA) ) M. Sawicki ( Southern Connecticut State Univ. (USA) ) - Publication title:
- Visual information processing XVI : 10 April 2007, Orlando, Forida [i.e. Florida], USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6575
- Pub. Year:
- 2007
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466976 [0819466972]
- Language:
- English
- Call no.:
- P63600/6575
- Type:
- Conference Proceedings
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