Examining explosive residues on surfaces with terahertz technology
- Author(s):
- Y. Dikmelik ( Johns Hopkins Univ. (USA) )
- M. J. Fitch ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
- M. R. Leahy-Hoppa ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
- R. Osiander ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
- Publication title:
- Terahertz for military and security applications V : 9-10 April 2007, Orlando, Florida, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6549
- Pub. Year:
- 2007
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466716 [0819466719]
- Language:
- English
- Call no.:
- P63600/6549
- Type:
- Conference Proceedings
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