Muon imaging and data modeling

Muon imaging and data modeling

Author(s):

H. M. Jaenisch ( dtech Systems Inc. (USA) )

J. W. Handley ( dtech Systems Inc. (USA) )

M. L. Hicklen ( dtech Systems Inc. (USA) )

D. C. Vineyard ( Decision Sciences Corp. (USA) )

M. D. Ramage ( Decision Sciences Corp. (USA) )

J. M. Colthart ( Decision Sciences Corp. (USA) )

1 more

Publication title:

Sensors, and command, control, communications, and intelligence (C3I) technologies for homeland security and homeland defense VI : 9-12 April 2007, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6538

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466600 [0819466603]

Language:

English

Call no.:

P63600/6538

Type:

Conference Proceedings

Details

TDL ID:	ZA00046845
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense VI
Conf. info. (Number):	2007 : 6th
Conf. info. (Venue):	Orlando, Florida, USA
Conf. info. (Date):	2007.04.09-2007.04.12

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