A study of process window capabilities for two-dimensional structures under double exposure condition

A study of process window capabilities for two-dimensional structures under double exposure condition

Author(s):

Q. Wu ( Shanghai Huahong NEC Electronics Co., Ltd. (China) )

P. Wu ( Shanghai Huahong NEC Electronics Co., Ltd. (China) )

J. Zhu ( Shanghai Integrated Circuit Research and Development Ctr. (China) )

H. Ding ( Shanghai Huahong NEC Electronics Co., Ltd. (China) )

X. Li ( Shanghai Huahong NEC Electronics Co., Ltd. (China) )

C. Sun ( Shanghai Huahong NEC Electronics Co., Ltd. (China) )

C. Peng ( Shanghai Huahong NEC Electronics Co., Ltd. (China) )

2 more

Publication title:

Optical microlithography XX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6520

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466396 [0819466395]

Language:

English

Call no.:

P63600/6520

Type:

Conference Proceedings

Details

TDL ID:	ZA00046827
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Optical Microlithography
Conf. info. (Number):	2007 : 20th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2007.02.27-2007.03.02

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