Extending immersion lithography with high-index materials: results of a feasibility study
- Author(s):
H. Sewell ( ASML US, Inc. (USA) ) J. Mulkens ( ASML Netherlands B.V. (Netherlands) ) P. Graeupner ( Zeiss SMT (Germany) ) D. McCafferty ( ASML US, Inc. (USA) ) L. Markoya ( ASML US, Inc. (USA) ) S. Donders ( ASML Netherlands B.V. (Netherlands) ) N. Samarakone ( ASML US, Inc. (USA) ) R. Duesing ( Zeiss SMT AG (Germany) ) - Publication title:
- Optical microlithography XX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6520
- Pub. Year:
- 2007
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466396 [0819466395]
- Language:
- English
- Call no.:
- P63600/6520
- Type:
- Conference Proceedings
Similar Items:
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
High-index immersion fluids enabling cost-effective single-exposure lithography for 32 nm half pitches
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Micrascan III:performance of a third-generation catadioptric step-and-scan lithographic tool
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
4
Conference Proceedings
Exploring the resolution limits of phase-shift mask lithography with a very high numerical aperture ArF step-and-scan system
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
High-index immersion lithography with second-generation immersion fluids to enable numerical aperatures of 1.55 for cost effective 32-nm half pitches
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |