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Extending immersion lithography with high-index materials: results of a feasibility study

Author(s):
H. Sewell ( ASML US, Inc. (USA) )
J. Mulkens ( ASML Netherlands B.V. (Netherlands) )
P. Graeupner ( Zeiss SMT (Germany) )
D. McCafferty ( ASML US, Inc. (USA) )
L. Markoya ( ASML US, Inc. (USA) )
S. Donders ( ASML Netherlands B.V. (Netherlands) )
N. Samarakone ( ASML US, Inc. (USA) )
R. Duesing ( Zeiss SMT AG (Germany) )
3 more
Publication title:
Optical microlithography XX
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6520
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466396 [0819466395]
Language:
English
Call no.:
P63600/6520
Type:
Conference Proceedings

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