Identification of in-field defect development in digital image sensors

Identification of in-field defect development in digital image sensors

Author(s):

J. Dudas ( Simon Fraser Univ. (Canada) )

L. M. Wu ( Simon Fraser Univ. (Canada) )

C. Jung ( Simon Fraser Univ. (Canada) )

G. H. Chapman ( Simon Fraser Univ. (Canada) )

Z. Koren ( Univ. of Massachusetts, Amherst (USA) )

I. Koren ( Univ. of Massachusetts, Amherst (USA) )

1 more

Publication title:

Digital photography III : 29-30 January 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6502

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466150 [0819466158]

Language:

English

Call no.:

P63600/6502

Type:

Conference Proceedings

Details

TDL ID:	ZA00046809
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Digital Photography
Conf. info. (Number):	2007 : 3rd
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2007.01.29-2007.01.30

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