Scanners for analytic print measurement: the devil in the details

Scanners for analytic print measurement: the devil in the details

Author(s):

E. K. Zeise ( Eastman Kodak Co. (USA) )
D. Williams ( Eastman Kodak Co. (USA) )
P. D. Burns ( Eastman Kodak Co. (USA) )
W. C. Kress ( Toshiba America Business Solutions (USA) )

Publication title:

Image quality and system performance IV : 30 January-1 February 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6494

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466075 [0819466077]

Language:

English

Call no.:

P63600/6494

Type:

Conference Proceedings

Details

TDL ID:	ZA00046802
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Image Quality and System Performance
Conf. info. (Number):	2007 : 4th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2007.01.30-2007.02.01

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