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Device calibration method for optical light modulator

Author(s):
  • Y. Bang ( Samsung Advanced Institute of Technology (South Korea) )
  • A. Baik ( Samsung Advanced Institute of Technology (South Korea) )
  • D. Park ( Samsung Advanced Institute of Technology (South Korea) )
  • I. Yeo ( Samsung Electro-Mechanics (South Korea) )
  • J. Han ( Samsung Electro-Mechanics (South Korea) )
Publication title:
Color imaging XII : processing, hardcopy, and applications : 30 January-1 February 2007, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6493
Pub. Year:
2007
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466068 [0819466069]
Language:
English
Call no.:
P63600/6493
Type:
Conference Proceedings

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